Photonic Materials Group - ARCIS
    Angle-Resolved Cathodoluminescence Imaging Spectroscopy

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A new nanophotonic measurement technique

Our group has developed a unique cathodoluminescence spectroscopy instrument that enables the study of nanophotonic structures with deep-subwavelength resolution. The instrument uses a 30 keV electron beam in a SEM to excite nanophotonic structures, while the emitted light is collected by a parabolic mirror placed between the sample and the microscope's electron column. 

 

Spectral analysis: measuring the local optical density of states

The collected radiation is spectrally analyzed for every electron beam position, so that a two-dimensional emission map can be recorded. This map is a direct measure of the local optical density of states (LDOS). The LDOS can be determined with a spatial resolution of 10-30 nm at any wavelength between 450 and 1800 nm.

 

Angular measurements: momentum spectroscopy

The new instrument is equipped with an imaging CCD camera that records the beam profile emitted from the mirror. From this profile the angle-resolved radiation pattern from the sample can be derived, enabling "momentum spectroscopy", measuring the in-plane wave vector of light at every frequency and position. Using this technqiue the local bandstructure of periodic and aperiodic structures can be determined with a spatial resolution of 10-30 nm.

ARCIS publications


last updated:  17-01-13